The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2007
Filed:
Oct. 08, 2003
Hiroki Kunitake, Tokyo, JP;
Takahiro Gotou, Tokyo, JP;
Yoshihiro Murota, Tokyo, JP;
Yoshiaki Hirata, Tokyo, JP;
Hiroki Kunitake, Tokyo, JP;
Takahiro Gotou, Tokyo, JP;
Yoshihiro Murota, Tokyo, JP;
Yoshiaki Hirata, Tokyo, JP;
Kabushiki Kaisha Bridgestone, Tokyo, JP;
Abstract
An uniformity inspection linecomprises a decision-only linehaving first UF machinesM exclusive for the measurement of the uniformity of a tiresorted and distributed on an automatic sorting lineand a correction-only linehaving second UF machinesM for the correction and re-measurement of the uniformity characteristics of a tire having uniformity characteristics outside specific values measured on the above decision-only line. Since the measurement of uniformity and the correction and re-measurement of uniformity characteristics are performed in different systems, uniformity inspection can be carried out efficiently even when the number of tires whose uniformity characteristics are to be corrected is varied.