The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2007

Filed:

Oct. 04, 2005
Applicants:

Weishi Feng, San Jose, CA (US);

Zhan Yu, Sunnyvale, CA (US);

Inventors:

Weishi Feng, San Jose, CA (US);

Zhan Yu, Sunnyvale, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

An error correcting Reed-Solomon decoder includes an error locator polynomial generator that generates an error locator polynomial and a scratch polynomial based on an inversionless Berlekamp-Massey algorithm (iBMA). An error location finder communicates with the error locator polynomial generator and generates error locations. An error values finder communicates with the error locator polynomial generator and generates error values directly from the error locator polynomial and the scratch polynomial.


Find Patent Forward Citations

Feng, Weishi. (2007). Error evaluator for inversionless berlekamp-massey algorithm in reed-solomon decoders (U.S. Patent No. 7249310). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7249310

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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