The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2007
Filed:
Dec. 30, 2004
Applicant:
Osamu Ichikawa, Osaka, JP;
Inventor:
Osamu Ichikawa, Osaka, JP;
Assignee:
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
The test method for a semiconductor integrated circuit includes a multi-cycle test step and a single-cycle test step. In the multi-cycle test step, a data-read side flipflop holds data according to a clock enable signal to test a multi-cycle path. In the single-cycle test step, no data is captured for the multi-cycle path.
Ichikawa, Osamu. (2007). Test method for a semiconductor integrated circuit having a multi-cycle path and a semiconductor integrated circuit (U.S. Patent No. 7249297). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7249297
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile