The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2007
Filed:
Mar. 28, 2003
Rasiklal Punjalal Shah, Latham, NY (US);
Vrinda Rajiv, Schenectady, NY (US);
Mark David Osborn, Schenectady, NY (US);
Catherine Mary Graichen, Malta, NY (US);
Amey Sudhakar Joshi, Karanataka, IN;
Sreevidya Sambasivan, Tamll Nadu, IN;
Jieqian Cathy Chen, Palo Alto, CA (US);
Ernest Joseph Waldron, Sussex, WI (US);
Rasiklal Punjalal Shah, Latham, NY (US);
Vrinda Rajiv, Schenectady, NY (US);
Mark David Osborn, Schenectady, NY (US);
Catherine Mary Graichen, Malta, NY (US);
Amey Sudhakar Joshi, Karanataka, IN;
Sreevidya Sambasivan, Tamll Nadu, IN;
Jieqian Cathy Chen, Palo Alto, CA (US);
Ernest Joseph Waldron, Sussex, WI (US);
GE Medical Systems, Inc., Waukesha, WI (US);
Abstract
A technique is provided for designing and evaluating service models for components, functions, subsystems and field replaceable units in a complex machine system. At a component or item level, each model identifies various items, failure modes, and so forth which may be the root cause of anticipated serviceable events or faults. The design tools permit numerous interfaces to be used in the design of service models, and in the evaluation of the degree to which the models address detectability and isolation capabilities for the root causes of serviceable events and faults.