The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2007
Filed:
Oct. 08, 2003
Eun-jin Ryu, Suwon, KR;
Jae-wook Lee, Ohsan, KR;
Eun-jin Ryu, Suwon, KR;
Jae-wook Lee, Ohsan, KR;
Samsung Electronics Co., Ltd., Kyunggi-do, KR;
Abstract
A defect signal detecting apparatus for an optical recording/reproducing apparatus that includes a maximum value detecting unit for detecting a highest amplitude among signals input during a maximum value detection period as a maximum value, a minimum value detecting unit for detecting a lowest amplitude among signals input during a minimum value detection period as a minimum value, an asymmetry detecting unit for calculating an amount δ of asymmetry by detecting a maximum value Iand a minimum value Iof a signal Ihaving a maximum periodicity among the signal input, and a maximum value Iand a minimum value Iof a signal Ihaving a minimum periodicity among the signal input, and a defect determining unit for determining whether there is a defect in the signal input, using the maximum value, the minimum value and the amount δ of asymmetry.