The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2007
Filed:
May. 02, 2005
Hiroaki Ueno, Kawasaki, JP;
Hiroaki Ueno, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A nonlinearity measuring method capable of measuring NLTS with a higher precision while taking the state of magnetization inversion of a preceding bit string into consideration. A constitution includes a first measuring section measuring a first predetermined higher harmonic component from a regenerated signal of the reference signal magnetically recorded on a medium, a second measuring section measuring a second predetermined higher harmonic component from regenerated signals with respect to plural kinds of signals to be measured magnetically recorded on the medium, and a calculating section calculating NLTS from the first component and the second component corresponding to each of the signals, wherein each of plural kinds of signals to be measured includes a magnetization inversion pattern string Ppreceding the objective bit to be measured of NLTS; thereby NLTS depending on the string Pcan be quantitatively measured easily.