The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2007

Filed:

Dec. 01, 2006
Applicant:

Jun Igarashi, Imaichi, JP;

Inventor:

Jun Igarashi, Imaichi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); B41J 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is an optical scanning system and an image forming apparatus having the same, wherein, in one preferred form of the invention, the optical scanning system includes a light source device, a deflecting device for scanningly deflecting a light beam from the light source device, and an imaging optical system for imaging, upon a scan surface to be scanned, the light beam deflected by the deflecting device, wherein the imaging optical system consists of a single imaging optical element with a light exit surface having a concave shape with respect to a main-scan sectional plane, and wherein relations0.5≦≦0.90<≦0.09are satisfied where φp is a power of the imaging optical element at an optical axis with respect to the main-scan direction, φm is a power of the imaging optical element at an outermost abaxial portion with respect to the main-scan direction, dp is a thickness of the imaging optical element at the optical axis, and kp is a k-θ coefficient of the imaging optical element at the optical axis.


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