The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2007
Filed:
Dec. 22, 2005
Peter Kiesel, Palo Alto, CA (US);
Oliver Wolst, Nürtingen, DE;
Michael Kneissl, Berlin, DE;
Huangpin Ben Hsieh, Mountain View, CA (US);
Oliver Schmidt, Palo Alto, CA (US);
Peter Kiesel, Palo Alto, CA (US);
Oliver Wolst, Nürtingen, DE;
Michael Kneissl, Berlin, DE;
Huangpin Ben Hsieh, Mountain View, CA (US);
Oliver Schmidt, Palo Alto, CA (US);
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Abstract
A sample detection system including an anti-resonant waveguide, including a sample having a first index of refraction, a top layer and a substrate surrounding the sample, where the top layer has a second index of refraction, and the substrate has a third index of refraction. The second index of refraction, and the third index of refraction are both greater than the first index of refraction. A detection device of the system includes a low power light source used to direct light into the sample and generate an anti-resonant optical mode in the sample, and an analyzing system to detect the interaction of the light propagating in the sample.