The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2007
Filed:
Jun. 17, 2005
Hou-ching Chin, Taipei, TW;
Hsaing-nan Chen, Taipei, TW;
Hou-Ching Chin, Taipei, TW;
Hsaing-Nan Chen, Taipei, TW;
Primax Electronics Ltd., Taipei, TW;
Abstract
A detection method for detecting quality of an optical element includes the following steps. Firstly, a point light source is provided. Then, the point light source is allowed to penetrate through the optical element, thereby forming a first optical image on an optical image processing device. Then, the position of the optical element is adjusted when there is a shade block included in the first optical image, and the point light source is allowed to penetrate through the optical element after the adjusting step, thereby forming a second optical image on the optical image processing device. Afterward, the first optical image is compared with the second optical image to discriminate whether the shade block is synchronously moved with position adjustment of the optical element so as to realize the quality of the optical element.