The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2007
Filed:
Feb. 12, 2003
John R Maddison, Tunbridge Wells, GB;
John R Maddison, Tunbridge Wells, GB;
Fairfield Imaging Limited, Kent, GB;
Abstract
A microscopy imaging system and method acquires digital images of a microscope specimen using a computer-controlled microscope and digital camera. A specimen on a microscope slide is placed within the microscope. The method comprises the steps of determining whether an area of the specimen contained within a microscope field of view has a thickness, and, if so, capturing digital images of the field of view at a plurality of depths of focus. In a preferred embodiment, the step of determining whether an area of the specimen contained within a microscope field of view has a thickness comprises the steps of: capturing a digital image of the field of view at two or more depths of focus; comparing the captured digital images, and determining that the specimen has a thickness, if the comparing step finds that the images are different. The method may be implemented in the form of a computer program.