The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2007
Filed:
Nov. 28, 2005
Dai-gil Lee, Daejeon, KR;
Seong-su Kim, Geojae-si, KR;
Byung-chul Kim, Daejeon, KR;
Dong-chang Park, Daejeon, KR;
Dai-Gil Lee, Daejeon, KR;
Seong-Su Kim, Geojae-si, KR;
Byung-Chul Kim, Daejeon, KR;
Dong-Chang Park, Daejeon, KR;
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Abstract
A probe card is used in conducting a visual test for a target test object through simultaneous contact of the probe card with each and every electrode pad of the target test object. The probe card includes a plurality of probes composed of conductive wire strands and having elastically deformable contact parts so curved as to make contact with electrode pads of a target test object. The contact parts are oriented in one and the same direction and extend in a parallel relationship with one another. The probe card further includes a first insulating block for fixedly securing one end parts of the probes, a second insulating block for fixedly securing the other end parts of the probes and a mounting plate for holding the first and second insulating blocks in such a manner that the contact parts of the probes protrude outwardly.