The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2007
Filed:
Aug. 27, 2004
Paul M. Green, Hollister, CA (US);
Peter Ivett, Morgan Hill, CA (US);
Wyman Pang, San Jose, CA (US);
Paul M. Green, Hollister, CA (US);
Peter Ivett, Morgan Hill, CA (US);
Wyman Pang, San Jose, CA (US);
Hitachi Global Storage Technologies Netherlands, B.V., Amsterdam, NL;
Abstract
A method for testing electromagnetic characteristics of magnetic media while maintaining consistent performance of a read/write head and recording channel is disclosed. The disclosed method is performed such that reduced statistical sampling is achieved. The method includes recording a first set of baseline measurements utilizing a first magnetic media with the read/write head and recording channel. The first magnetic media is then removed from an assembly containing the read/write head and recording channel and is replaced with a second magnetic media. Measurements are made utilizing the second magnetic media with the read/write head and recording channel, wherein the measurements are comparable with the baseline measurements and wherein consistent performance of the read/write head and the recording channel is maintained so as to reduce the size of statistical samples needed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile