The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2007

Filed:

Jul. 19, 2006
Applicants:

Richard Hular, San Carlos, CA (US);

Liuz B. Da Silva, Danville, CA (US);

Charles L. Chase, Discovery Bay, CA (US);

Bruce W. Haughey, Redwood City, CA (US);

Inventors:

Richard Hular, San Carlos, CA (US);

Liuz B. Da Silva, Danville, CA (US);

Charles L. Chase, Discovery Bay, CA (US);

Bruce W. Haughey, Redwood City, CA (US);

Assignee:

BioLuminate, Inc., San Carlos, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 27/26 (2006.01); A61B 8/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A low capacitance measurement probe having an outer conductor forming an outer wall; a non-conductive spacer forming a first wall between a conductive layer and the outer conductor; the conductive layer forming a second wall coupled to the interior of the first wall; an insulating layer forming a third wall coupled to the interior of the second wall; and an inner conductor forming an inner wall coupled to the interior of the third wall. The probe may include a knob or a button in the inner conductor at a tip of the probe to increase the surface area of the inner conductor in order to the sensitivity of the probe.


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