The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2007

Filed:

May. 31, 2006
Applicants:

Ing-shouh Hwang, Taipei, TW;

En-te HU, Taipei, TW;

Kuang-yuh Huang, Taipei, TW;

Inventors:

Ing-Shouh Hwang, Taipei, TW;

En-Te Hu, Taipei, TW;

Kuang-Yuh Huang, Taipei, TW;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/40 (2006.01); G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for measurement of the height, angle and their variations of the surface of an object comprises a measurement module and an astigmatic optical path mechanism. The optical path mechanism makes a laser beam pass a lens assembly and focus on an object. The reflected light passes the lens assembly and an astigmatic lens, arriving at the photo sensor assembly, forming a light spot thereon. The translational displacements of the object are measured by the variations in shape of the light spot on the photo sensors. The angular displacements of the object are measured accordingly by the movement of the light spot on the photo sensors.


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