The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2007

Filed:

Mar. 11, 2005
Applicants:

Dotan Knaan, Jerusalem, IL;

Jeremy Yermiyahu Kaminski, Jerusalem, IL;

Adi Shavit, Jerusalem, IL;

Dana Shavit, Jerusalem, IL;

Kazufumi Suzuki, Tokyo, JP;

Norio Ichihashi, Tokyo, JP;

Akio Takahashi, Wako, JP;

Akihito Kimata, Wako, JP;

Inventors:

Dotan Knaan, Jerusalem, IL;

Jeremy Yermiyahu Kaminski, Jerusalem, IL;

Adi Shavit, Jerusalem, IL;

Dana Shavit, Jerusalem, IL;

Kazufumi Suzuki, Tokyo, JP;

Norio Ichihashi, Tokyo, JP;

Akio Takahashi, Wako, JP;

Akihito Kimata, Wako, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A line-of-sight detection method in an imaging system which includes a camera for photographing a face and right and left eyes and a light source for irradiating the right and left eyes with infrared rays, said line-of-sight detection method comprising:


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