The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2007
Filed:
Oct. 04, 2004
Thomas G. Bartz, Loveland, CO (US);
Abhay Sathe, Fort Collins, CO (US);
Thomas G. Bartz, Loveland, CO (US);
Abhay Sathe, Fort Collins, CO (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
Methods of error-tolerant modular testing of services are described, wherein an ordered list of test module identifiers is built in an error stack for the purposes of structured state teardown following the occurrence of an error during testing of services (i.e., network or other.) The error that triggers the teardown may comprise any error or more particularly an error not among a predetermined list of acceptable errors, the occurrence of which should not cause the cessation of services testing. Upon the occurrence of a triggering error, the test modules associated with the test module identifiers are executed in a reverse order to that which the test module identifiers were added to the error stack, effecting a structured state teardown.