The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2007

Filed:

Apr. 22, 2004
Applicants:

Eric L. Barsness, Pine Island, MN (US);

Peter J. Johnson, Rochester, MN (US);

Michael P. Koranda, Rochester, MN (US);

Randy W. Ruhlow, Rochester, MN (US);

John M. Santosuosso, Rochester, MN (US);

Inventors:

Eric L. Barsness, Pine Island, MN (US);

Peter J. Johnson, Rochester, MN (US);

Michael P. Koranda, Rochester, MN (US);

Randy W. Ruhlow, Rochester, MN (US);

John M. Santosuosso, Rochester, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system, method and article of manufacture for identification of mergeable data in a data processing system and, more particularly, for providing mechanisms for facilitating identification of correlated columns from one or more database tables. One embodiment provides a computer-implemented method for managing storage of data having an associated measurement unit in a database table. The method includes storing the data in a column of the database table and generating units metadata describing the measurement unit. The units metadata is associated with the column of the database table.


Find Patent Forward Citations

Barsness, Eric. (2007). Method, system and article of manufacturing for converting data values quantified using a first measurement unit into equivalent data values when quantified using a second measurement unit in order to receive query results including data values measured using at least one of the first and second measurement units (U.S. Patent No. 7246116). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7246116

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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