The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2007

Filed:

May. 24, 2004
Applicants:

William Lo, Cupertino, CA (US);

Francis Campana, Milpitas, CA (US);

Inventors:

William Lo, Cupertino, CA (US);

Francis Campana, Milpitas, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

An interpolator testing system and method comprises an interpolator that includes a phase shift module. The phase shift module receives a reference clock signal and generates M clock signals having phase shifts in increments of 360/M degrees relative to the reference clock signal. A phase select module receives the reference clock signal and a recovered clock signal during a normal mode and generates a select signal based on a comparison of the reference clock signal and the recovered clock signal during the normal mode. A selector receives the M clock signals and outputs one of the M clock signals as the recovered clock signal based on the select signal. A recovered clock counter counts an attribute of the recovered clock signal during a test mode. The phase select module sequentially selects the M clock signals N times during the test mode.


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