The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2007
Filed:
Jul. 10, 2003
Applicants:
Xiaochuan Pan, Chicago, IL (US);
Lifeng Yu, Chicago, IL (US);
Chien-min Kao, Wilmette, IL (US);
Inventors:
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus are provided for reconstructing a tomographic image from fan-beam or cone-beam data. The method includes the steps of collecting fan-beam or cone-beam data over an image space, converting the fan-beam or cone-beam data to parallel-beam data with respect to a rotation angle within the image space, performing a shift variant filtration of the parallel-beam data within the image space and converting the processed data to images through backprojection or other means.
Pan, Xiaochuan. (2007). Algorithm for image reconstruction and image noise analysis in computed tomography (U.S. Patent No. 7245755). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7245755
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile