The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2007
Filed:
Jun. 02, 2005
Dean C. Buck, Loveland, CO (US);
Tracy Eliasson, Boulder, CO (US);
Anthony C. Turner, Drake, CO (US);
Ronald K. Kerschner, Loveland, CO (US);
Dean C. Buck, Loveland, CO (US);
Tracy Eliasson, Boulder, CO (US);
Anthony C. Turner, Drake, CO (US);
Ronald K. Kerschner, Loveland, CO (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
An x-ray inspection system. The x-ray inspection system includes an x-ray source, an on-axis x-ray sensor, at least one off-axis x-ray sensor, a fixture, and an accumulation circuit. The on-axis x-ray sensor is configured to capture on-axis images of radiation from the x-ray source. The x-ray source is displaced from the on-axis x-ray sensor, and the x-ray source and the on-axis x-ray sensor are positioned on an axis conceptually drawn between the x-ray source and the on-axis x-ray sensor. At least one off-axis x-ray sensor is configured to capture off-axis images of radiation from the x-ray source, wherein each off-axis x-ray sensor is positioned off the axis. The fixture is configured to maintain an article between the x-ray source and the on-axis and off-axis x-ray sensors, and the accumulation circuit is configured to receive and accumulate images captured by the on-axis and off-axis x-ray sensors.