The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2007
Filed:
Mar. 07, 2003
Katsuyuki Yamada, Zama, JP;
Yuki Nakamura, Zama, JP;
Shinya Narumi, Yokohama, JP;
Masaki Kato, Sagamihara, JP;
Katsuyuki Yamada, Zama, JP;
Yuki Nakamura, Zama, JP;
Shinya Narumi, Yokohama, JP;
Masaki Kato, Sagamihara, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An optical recording medium including a substrate having guide groove thereon; a first protective layer located overlying the substrate; a recording layer located overlying the first protective layer; a second protective layer located overlying the recording layer; a third protective layer of from 2 to 9 nm thick located overlying the second protective layer and comprising Si in an amount not less than 35 atomic percent; and a reflection layer including Ag in an amount not less than 95% by weight. An overcoat layer having a glass transition temperature of from 90° C. to 180° C. is preferably formed overlying the reflection layer. A method for manufacturing the optical recording medium is also provided.