The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2007
Filed:
Feb. 10, 2003
Takahiro Mamiya, Komaki, JP;
Ikuo Futamura, Komaki, JP;
Takahiro Mamiya, Komaki, JP;
Ikuo Futamura, Komaki, JP;
CKD Corporation, Aichi, JP;
Abstract
For measuring the three-dimensional shape of an object of measurement using a phase shift method, a three-dimensional shortening the measurement time. A printed state inspection deviceincludes a printed circuit board K printed with cream solder H, an illumination devicefor illuminating three sine wave light component patterns with different phases on the surface of printed circuit board K, and a CCD camerafor picking-up images of the illuminated part of the printed circuit board K. A control devicecreates a chart representing a relationship between brightness and coordinates for each light component from the image data obtained by the illumination of the light component patterns and determines relative phase angles among the light component patterns, and calculates the height of the cream solder H from the image data and the relative phase angles.