The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2007
Filed:
Nov. 21, 2003
Robert Frans Maria Hendriks, Eindhoven, NL;
Robert Frans Maria Hendriks, Eindhoven, NL;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
An optical analysis system (), which is arranged to determine amplitude of a principal component of an optical signal, includes a first detector () for detecting the optical signal weighted by a first spectral weighting function, and a second detector () for detecting the optical signal weighted by a second spectral weighting function. For an improved signal-to-noise ratio, the optical analysis system () further includes a dispersive element () for spectrally dispersing the optical signal, and a distribution element () for receiving the spectrally dispersed optical signal and for distributing a first part of the optical signal weighted by the first spectral weighting function to the first detector () and a second part of the optical signal weighted by the second spectral weighting function to the second detector (). The optical analysis system () is suited for use in numerous applications including a spectroscopic analysis system () and a blood analysis system ().