The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2007

Filed:

Nov. 08, 2004
Applicant:

Wan-taek Han, Hwaseong-si, KR;

Inventor:

Wan-taek Han, Hwaseong-si, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/40 (2006.01); G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An analyzing method and system includes projecting light onto a specimen, detecting an optical spectrum from the specimen, dividing the detected optical spectrum by a predetermined time interval, applying a weighting vector and a gain and offset vector to the divided spectra to generate a resolution vector, quantizing an analog signal of the resolution vector to a digital signal, and applying a synthesis vector to the quantized spectra to restore the quantized spectra to a size of the optical spectrum. A spectrum having a large amplitude difference is temporally divided and is analyzed by applying different resolutions to individual time intervals. Spectral portions of the spectrum having relatively small peak amplitudes are selected as a region of interest (ROI) to be modified.


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