The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2007
Filed:
Apr. 26, 2005
Toshiya Kobayashi, Kariya, JP;
Tadashi Kajino, Okazaki, JP;
Toshiya Kobayashi, Kariya, JP;
Tadashi Kajino, Okazaki, JP;
Nidek Co., Ltd., Gamagori-shi, JP;
Abstract
A lens meter excellent in operability during alignment capable of informing in which direction a subject lens should be moved. A lens meter has a measurement optical system having an optical axis, a light source projecting a light bundle onto the lens, and a photo-sensor photo-receiving the bundle, a part which obtains the optical characteristics from a photo-receiving result, a device which detects an alignment condition of a desired position or region with the axis, a part which displays an alignment screen, and a part which provides fixed display of a target mark indicating a measurement position or region and provides movable display of a lens mark representing the lens and a guide mark indicating an alignment target position or region, where a movement direction of the lens relative to the axis coincides with movement directions of the lens mark and the guide mark relative to the target mark.