The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2007

Filed:

Aug. 18, 2004
Applicants:

Wolfgang Härer, Möhrendorf, DE;

Peter Speier, Erlangen, DE;

Inventors:

Wolfgang Härer, Möhrendorf, DE;

Peter Speier, Erlangen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method and MRI apparatus for the minimization of streak artifacts in modular k-space scanning in magnetic resonance imaging, an odd integer k-space scanning module number N=2n+1 is defined that defines the number of incrementally rotated repeated modules of the k-space scanning process, a slice selection gradient selects any slice in the range of the object to be examined, and data for all Nangle-oriented k-space scanning modules in the selected slice acquired such that each k-space scanning module has an azmuthal distance of from both adjacent projections, with the direction of the scanning of the adjacent k-space scanning modules alternating.


Find Patent Forward Citations

Härer, Wolfgang. (2007). Magnetic resonance imaging apparatus and method wherein streak artifacts are minimized in modular k-space scanning (U.S. Patent No. 7245125). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7245125

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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