The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2007

Filed:

Oct. 15, 2002
Applicants:

Andrew J. Gabura, Penetanguishene, CA;

Blaise R. Robitaille, Penetanguishene, CA;

Roger W. Ball, Midland, CA;

Inventors:

Andrew J. Gabura, Penetanguishene, CA;

Blaise R. Robitaille, Penetanguishene, CA;

Roger W. Ball, Midland, CA;

Assignee:

Raytheon Company, Lexington, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical measurement apparatus operable with a test specimen has a light source with a laser having an output beam, and a beam splitter that splits the output beam of the laser into a first split beam and a second split beam. A test specimen holder holds the test specimen therein. A first optical fiber receives the first split beam and directs the first split beam against the test specimen in the test specimen holder. The apparatus further includes an instrumentation module. A second optical fiber receives the second split beam and conducts the second split beam to the instrumentation module. A third optical fiber receives signal light from the test specimen in the test specimen holder and conducts the signal light to the instrumentation module.


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