The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2007
Filed:
Aug. 15, 2005
Karl E. Nelson, Livermore, CA (US);
John D. Valentine, Redwood City, CA (US);
Brock R. Beauchamp, San Ramon, CA (US);
Karl E. Nelson, Livermore, CA (US);
John D. Valentine, Redwood City, CA (US);
Brock R. Beauchamp, San Ramon, CA (US);
The Regents of the University of California, Oakland, CA (US);
Abstract
A method and system using the Sequential Probability Ratio Test to enhance the detection of an elevated level of radiation, by determining whether a set of observations are consistent with a specified model within a given bounds of statistical significance. In particular, the SPRT is used in the present invention to maximize the range of detection, by providing processing mechanisms for estimating the dynamic background radiation, adjusting the models to reflect the amount of background knowledge at the current point in time, analyzing the current sample using the models to determine statistical significance, and determining when the sample has returned to the expected background conditions.