The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2007

Filed:

Nov. 30, 2005
Applicants:

Masatoshi Ishikawa, Kashiwa, JP;

Idaku Ishii, Koganei, JP;

Takashi Komuro, Tokyo, JP;

Shingo Kagami, Tokyo, JP;

Inventors:

Masatoshi Ishikawa, Kashiwa, JP;

Idaku Ishii, Koganei, JP;

Takashi Komuro, Tokyo, JP;

Shingo Kagami, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor integrated circuit device is provided which has a plurality of photo detector circuits and a plurality of processing elements. Each of the photo detector circuits includes a comparing circuit, which compares an output of a photo detector element with a reference voltage. A/D conversion is performed by counting the elapsed time until the output of the photo detector element drops below the reference voltage, and a level of the reference voltage as a function of time to be applied to the comparing circuit and time intervals of the counting are uniquely determined based on given quantization intervals of an amount of current generated by the photo detector element. In addition, the photo detector elements may be reset locally based on the result of the corresponding processing element.


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