The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2007
Filed:
Apr. 12, 2006
Kouji Nishio, Itabashi-ku, JP;
Yasufumi Fukuma, Itabashi-ku, JP;
Katsuhiko Kobayashi, Itabashi-ku, JP;
Kouji Nishio, Itabashi-ku, JP;
Yasufumi Fukuma, Itabashi-ku, JP;
Katsuhiko Kobayashi, Itabashi-ku, JP;
Kabushiki Kaisha TOPCON, Tokyo-to, JP;
Abstract
An eye's optical characteristics measuring system, comprising a first target projection optical system for projecting a target image on a fundus of an eye under test, a first photodetecting means for receiving the target image reflected from the fundus of the eye under test from the first target image projecting optical system, an ocular refractive power measuring unit for measuring ocular refractive power of the eye under test based on photodetection result from the first photodetecting means, a second target projecting means for projecting a spot-like target image to the fundus of the eye under test, a second photodetecting means for receiving the target image reflected from the fundus of the eye under test, and an eye's optical characteristics measuring unit for measuring ocular refractive power based on two or more images acquired at a predetermined refractive degree pitch before and after centering the refractive degree of the eye under test obtained by the second photodetecting means.