The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2007

Filed:

Jan. 27, 2005
Applicants:

Jean-maurice Tellenbach, Hettlingen, CH;

Volker Ziebart, Schlatt, CH;

Inventors:

Jean-Maurice Tellenbach, Hettlingen, CH;

Volker Ziebart, Schlatt, CH;

Assignee:

Mettler-Toledo AG, Greifensee, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a force-measuring cell with a deformable body and with at least one strain gauge which has a strain-sensitive electrical resistor track arranged on a polymer carrier substrate, the strain gauge is bonded to the deformable body by an adhesive layer of an inorganic-organic hybrid polymer. For the bonding of the strain gauge to the deformable body, an adhesive compound having an inorganic-organic hybrid polymer in solution is applied to the deformable body, whereupon the strain gauge is placed on the hybrid polymer layer, and the adhesive layer is subsequently hardened at a temperature between 80° C. and 130° C. For the hardening of the adhesive layer, the deformable body with the strain gauge is exposed to the increased temperature for a time period between a half hour and three hours.


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