The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2007
Filed:
Jul. 10, 2001
Victor Xiao Dong Yang, Toronto, CA;
I. Alex Vitkin, Toronto, CA;
Louis M. Wongkeesong, Rochester, MN (US);
Sharon Katz, Windsor, CA;
Margaret Leslie Gordon, Toronto, CA;
Brian C. Wilson, Toronto, CA;
Alvin Ho Kwan Mok, Richmond Hill, CA;
Victor Xiao Dong Yang, Toronto, CA;
I. Alex Vitkin, Toronto, CA;
Louis M. WongKeeSong, Rochester, MN (US);
Sharon Katz, Windsor, CA;
Margaret Leslie Gordon, Toronto, CA;
Brian C. Wilson, Toronto, CA;
Alvin Ho Kwan Mok, Richmond Hill, CA;
University Health Network, Toronto, Ontario, CA;
Abstract
A method and an apparatus for examining the subsurface microstructure of a sample are provided. Radiation from a plurality of optical radiation sources travels along a first optical path. In the first optical path, a device focuses the optical radiati n from each of the optical sources into a plurality of respective focal points along the first optical path to provide substantially continuous coverage of a selected portion of the first optical path. Then, a sample on the first optical path within the selected length extending into the sample is scanned along said selected portion of the first optical path.