The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2007
Filed:
Aug. 12, 2004
Ketao Liu, Cerritos, CA (US);
Cameron Massey, Hawthorne, CA (US);
William Barvosa-carter, Ventura, CA (US);
Michael Nolan, Hermosa Beach, CA (US);
Ketao Liu, Cerritos, CA (US);
Cameron Massey, Hawthorne, CA (US);
William Barvosa-Carter, Ventura, CA (US);
Michael Nolan, Hermosa Beach, CA (US);
The Boeing Company, Chicago, IL (US);
Abstract
A laser metrology system for estimating the deformation of a structure is provided. The system includes a plurality of laser beam position detectors distributed across a surface of the structure. Each laser beam position detector is intersected by a laser beam and is configured to determine the change in location of the intersection point in at least one dimension. By determining the change in location of the intersection point for each laser beam position detector, the laser metrology system can calculate the deformation of the structure that caused these changes in location.