The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2007

Filed:

Nov. 12, 2004
Applicants:

Hong Wang, Cupertino, CA (US);

Zhimin Liu, San Jose, CA (US);

Inventors:

Hong Wang, Cupertino, CA (US);

Zhimin Liu, San Jose, CA (US);

Assignee:

Opto Trace Technologies, Inc., Sunnyvale, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

New and improved applications of Raman Scattering are disclosed. These applications may be implemented with or without using an enhanced nano-structured surface that is trademarked as the RamanNanoChip™ disclosed in a pending patent. As a RamanNanoChip™ provides much higher sensitivity in SERS compared with conventional enhance surface, broader scopes of applications are now enabled and can be practically implemented as now disclosed in this application. Furthermore, a wide range of applications is achievable as new and improved Raman sensing applications. By applying the analysis of Raman scattering spectrum, applications can be carried out to identify unknown chemical compositions to perform the tasks of homeland security; food, drug and drinking materials safety; early disease diagnosis; environmental monitoring; industrial process monitoring, precious metal and gem authentications, etc.


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