The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2007
Filed:
May. 17, 2005
Pei-rin Wu, Lincoln, MA (US);
Michael T. Burrows, Lexington, MA (US);
Gordon L. Dryden, Lawrence, MA (US);
Pei-Rin Wu, Lincoln, MA (US);
Michael T. Burrows, Lexington, MA (US);
Gordon L. Dryden, Lawrence, MA (US);
Sparta, Inc., Lake Forest, CA (US);
Abstract
A system for obtaining frequency domain interferometric super-resolution of a target scatterer, having a first and a second coherent transceivers, a mutual coherent sub-system and an estimation system. The first and second coherent transceivers are operative to produce a plurality of first and second sampling signals separated from each other by a predetermined frequency difference within the first and second sub-band, respectively. The mutual coherent sub-system is coupled to the first and second coherent transceivers to receive phase and amplitude of the first and second sampling signals, so as to evaluate an ambiguous range estimate from a pair of the first and second sampling signals and an unambiguous range estimate from a pair of the first and/or second sampling signals. The estimation system follows the mutual coherent sub-system to reconcile the ambiguous and unambiguous range estimates so as to obtain a target signature with a super-resolution defined by a frequency offset between the first and second sub-bands.