The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2007

Filed:

Nov. 01, 2005
Applicants:

Deok Hyun Lee, Seoul, KR;

Myung Sik Choi, Daejeon, KR;

DO Haeng Hur, Daejeon, KR;

Jung Ho Han, Daejeon, KR;

Inventors:

Deok Hyun Lee, Seoul, KR;

Myung Sik Choi, Daejeon, KR;

Do Haeng Hur, Daejeon, KR;

Jung Ho Han, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/08 (2006.01); G01N 27/82 (2006.01); G01N 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is an apparatus for concurrently detecting a defect occurring in a heat exchanger tube and a geometric transition of the heat exchanger tube. The apparatus for detecting the state of a heat exchanger tube, including: the first detection unit detecting a defect of the heat exchanger tube; and the second detection unit detecting a geometric transition of the heat exchanger tube, in which the first detection unit and the second detection unit are disposed at the same circumferential position of a cylindrical body separately, installed to have a certain distance in the lengthwise direction of the cylindrical body, and inserted inside the heat exchanger tube. According to the present invention, not only a defect but also the type of geometric transition, which may accelerate the initiation and growth of a defect, is identified and the size of the geometric transition is concurrently measured, thereby improving the reliability in early detection of a defect.


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