The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2007
Filed:
May. 12, 2003
Rudolf Rigler, Gottingen, DE;
Manfred Eigen, Gottingen, DE;
Karsten Henco, Erkrath, DE;
Ulo Mets, Tallin, EE;
Jerker Widengren, Solna, SE;
Michael Stuke, Gottingen, DE;
Michael Brinkmeyer, Gottingen, DE;
Wolfgang Simm, Rosdorf, DE;
Olaf Lehman, Gottingen, DE;
Rudolf Rigler, Gottingen, DE;
Manfred Eigen, Gottingen, DE;
Karsten Henco, Erkrath, DE;
Ulo Mets, Tallin, EE;
Jerker Widengren, Solna, SE;
Michael Stuke, Gottingen, DE;
Michael Brinkmeyer, Gottingen, DE;
Wolfgang Simm, Rosdorf, DE;
Olaf Lehman, Gottingen, DE;
Olympus Corporation, Tokyo, JP;
Abstract
A Method for identifying one or a small number of molecules, especially in a dilution of ≦1 μM, using laser excited FCS with measuring times ≦500 ms and short diffusion paths of the molecules to be analyzed, wherein the measurement is performed in small volume units of preferably ≦10l, by determining material-specific parameters which are determined by luminescence measurements of molecules to be examined. The device which can be preferably used for performing the method according to the invention is a per se known system of microscope optics for laser focusing for fluorescence excitation in a small measuring compartment of a very diluted solution and for imaging the emitted light in the subsequent measurement through confocal imaging wherein at least one system of optics with high numerical aperture of preferably ≧1.2 N.A. is employed, the light quantity is limited by a confocally arranged pinhole aperture in the object plane behind the microscope objective, and the measuring compartment is positioned at a distance of between 0 and 1000 μm from the observation objective.