The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2007
Filed:
May. 23, 2003
Wafa Skalli, Paris, FR;
Raphaël Dumas, Paris, FR;
David Mitton, Kremlin Bic{circumflex over ())}{circumflex over (})}tre, FR;
Philippe Bataille, Paris, FR;
Damien Quidet, Meaux, FR;
Wafa Skalli, Paris, FR;
Raphaël Dumas, Paris, FR;
David Mitton, Kremlin Bic{circumflex over ())}{circumflex over (})}tre, FR;
Philippe Bataille, Paris, FR;
Damien Quidet, Meaux, FR;
Centre National de la Recherche Scientifique, Paris, FR;
Ecole Nationale Superieure d'Arts et Metiers, Paris, FR;
Abstract
A calibration system is disclosed for a stereoradiographic device having an X-ray source and a vertical X-ray receiver, the calibration system includes a horizontal table which rotates between two reference positions that are separated by 90 degrees in a horizontal plane of the table. A vertical frame is fastened to the horizontal table and is symmetrical with an axis of rotation of the table, the frame accommodates a patient that remains stationary relative to the frame as the table is rotated between its two reference positions wherein corresponding X-ray photographs are taken. At least three markers made of radio-opaque material are firmly attached to the frame, one of the markers represents the origin of orthogonal X,Y and Z axes, a second of the markers is located at a predetermined point along the X-Y axes, the third marker located at a known distance along the Z axis, the markers defining respective distances Lx, Ly or H relative to the origin.