The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2007

Filed:

Feb. 21, 2005
Applicants:

John Stanley Bialas, Jr., South Burlington, VT (US);

Ralph D. Kilmoyer, Essex Junction, VT (US);

Inventors:

John Stanley Bialas, Jr., South Burlington, VT (US);

Ralph D. Kilmoyer, Essex Junction, VT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for performing stuck fault testings within an integrated circuit is disclosed. A delay chain structure includes a first select register, a second select register, a decoder and a chain of multiplexors. With a set of select signals, the first select register generates a set of true encoded select signals, and the second select register generates a set of complement encoded select signals. Coupled to the first and second select registers, the decoder decodes the set of true encoded select signals and the set of complement encoded signals for controlling the chain of multiplexors. Each multiplexor within the chain of multiplexors is connected to one of the outputs of the decoder. The chain of multiplexors generates a single output value based on the set of select signals.


Find Patent Forward Citations

Loading…