The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2007

Filed:

Feb. 27, 2004
Applicants:

Nicolas G. Adiba, San Jose, CA (US);

Roberta J. Cochrane, Los Gatos, CA (US);

Elizabeth B. Hamel, Morgan Hill, CA (US);

Somil D. Kulkarni, San Jose, CA (US);

Bruce G. Lindsay, San Jose, CA (US);

Inventors:

Nicolas G. Adiba, San Jose, CA (US);

Roberta J. Cochrane, Los Gatos, CA (US);

Elizabeth B. Hamel, Morgan Hill, CA (US);

Somil D. Kulkarni, San Jose, CA (US);

Bruce G. Lindsay, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

An improved method and system for preserving data constraints during parallel apply in asynchronous transaction replication in a database system have been disclosed. The method and system preserves secondary unique constraints and referential integrity constraints, while also allowing a high degree of parallelism in the application of asynchronous replication transactions. The method and system also detects and resolves ordering problems introduced by referential integrity cascade deletes, and allows the parallel initial loading of parent and child tables of a referential integrity constraint.


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