The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2007

Filed:

Apr. 06, 2004
Applicants:

Nicolaie Laurentiu Fantana, Heidelberg, DE;

Lars Pettersson, Ludvika, SE;

Mark D. Perkins, St. Charles, MO (US);

Ramsis S. Girgis, Wildwood, MO (US);

Asim Fazlagic, St. Louis, MO (US);

Inventors:

Nicolaie Laurentiu Fantana, Heidelberg, DE;

Lars Pettersson, Ludvika, SE;

Mark D. Perkins, St. Charles, MO (US);

Ramsis S. Girgis, Wildwood, MO (US);

Asim Fazlagic, St. Louis, MO (US);

Assignee:

ABB Patent GmbH, Ladenburg, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for the systematic evaluation and rating of technical equipment using a data processing device (), which works together with at least one data memory () and has an input () and display device (), in which, step-by-step for the particular technical equipment, at least one first data set having economically relevant input parameters and at least one second data set having technically relevant input parameters are detected and/or established. For each data set, through knowledge-based predetermined numerical and/or logical linkages and knowledge-based predetermined weighting factors specific to the equipment, the established input parameters are brought together into an economic evaluation parameter FIx and a technical evaluation parameter RIx, respectively, and from the established evaluation parameters, through knowledge-based predetermined numerical linkages and weighting factors, a single overall resulting evaluation parameter EIx is determined.


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