The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2007
Filed:
May. 07, 2003
Konomu Hirao, Kyoto, JP;
Konomu Hirao, Kyoto, JP;
Arkray, Inc., Kyoto, JP;
Abstract
The invention relates to measuring the concentration of a target component in an object. The invention provides a component concentration measurement method including a first step in which light is irradiated onto a measurement object held in a first magnetic field state for detecting the light from the object, a second step in which light is irradiated onto the object held in a second magnetic field state different from the first state for detecting the light from the object, and a third step in which the concentration of the target component is calculated based on the detection results in the first and the second steps. The first magnetic field state may be a magnetic-field-modulated state, while the second state may be a non-magnetic-field-modulated state.