The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2007
Filed:
Mar. 04, 2003
Kaoru Yasukawa, Kanagawa, JP;
Koji Adachi, Kanagawa, JP;
Norikazu Yamada, Kanagawa, JP;
Eigo Nakagawa, Kanagawa, JP;
Koki Uwatoko, Kanagawa, JP;
Tetsuichi Satonaga, Kanagawa, JP;
Kaoru Yasukawa, Kanagawa, JP;
Koji Adachi, Kanagawa, JP;
Norikazu Yamada, Kanagawa, JP;
Eigo Nakagawa, Kanagawa, JP;
Koki Uwatoko, Kanagawa, JP;
Tetsuichi Satonaga, Kanagawa, JP;
Fuji Xerox Co., Ltd., Tokyo, JP;
Abstract
An image defect inspecting apparatus of the present invention includes a template image producing section for producing a template image from reference image data, a corresponding image extracting section for extracting a predetermined image located at a position corresponding to a template image from digital data of a scanned image for inspection, data embedding sections for embedding desired same pattern data into the template image and the image extracted by the corresponding image extracting section, a normalized correlation value calculation processing unit for acquiring a normalized correlation coefficient from the template image and the extracted image, into which the pattern data is embedded, and a defect judging section for judging as to whether a defect is present by comparing the normalized correlation coefficient acquired by the normalized correlation value calculation processing unit with a predetermined threshold value so as to acquire a large/small relationship thereof.