The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2007

Filed:

Jan. 12, 2004
Applicants:

Michael Bock, Heidelberg, DE;

Reiner Umathum, Heidelberg, DE;

Hans-joachim Zabel, Heidelberg, DE;

Inventors:

Michael Bock, Heidelberg, DE;

Reiner Umathum, Heidelberg, DE;

Hans-Joachim Zabel, Heidelberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method and an apparatus for measuring the position and the orientation of an interventional device within a magnetic resonance imaging apparatus, the magnetic resonance image apparatus providing a static magnetic field Band magnetic field gradients with known magnetic flux densities and directions. The invention includes attaching a Faraday sensor to the interventional device, the Faraday sensor being connected to an optical measuring device. The method also includes using the optical measuring device for measuring the rotation of the plane of polarization of linearly polarized light in the Faraday sensor, while exposing the interventional device: (i) to the static magnetic field B, and (ii) to the field gradients in all three directions of space in addition to the static magnetic field B. The method also includes determining the position and the orientation of the interventional device by evaluating the measured rotation of the plane of polarization of the linearly polarized light.


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