The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2007

Filed:

Aug. 17, 2004
Applicants:

Michael P. Chrisp, Danville, CA (US);

Scott A. Lerner, Corvallis, OR (US);

Paul J. Kuzmenko, Livermore, CA (US);

Charles L. Bennett, Livermore, CA (US);

Inventors:

Michael P. Chrisp, Danville, CA (US);

Scott A. Lerner, Corvallis, OR (US);

Paul J. Kuzmenko, Livermore, CA (US);

Charles L. Bennett, Livermore, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A compact imaging spectrometer with an immersive diffraction grating that compensates optical distortions. The imaging spectrometer comprises an entrance slit for transmitting light, means for receiving the light and directing the light, an immersion grating, and a detector array. The entrance slit, the means for receiving the light, the immersion grating, and the detector array are positioned wherein the entrance slit transmits light to the means for receiving the light and the means for receiving the light directs the light to the immersion grating and the immersion grating receives the light and directs the light to the means for receiving the light, and the means for receiving the light directs the light to the detector array.


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