The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2007
Filed:
Aug. 14, 2003
Toshiro Kume, Osaka, JP;
Masashi Shoji, Osaka, JP;
Emiko Igaki, Amagasaki, JP;
Shuji Tsutsumi, Ikoma, JP;
Mikinari Shimada, Yawata, JP;
Masakazu Tanahashi, Osaka, JP;
Akira Takahashi, Kadoma, JP;
Shouichi Imashuku, Moriguchi, JP;
Toshiro Kume, Osaka, JP;
Masashi Shoji, Osaka, JP;
Emiko Igaki, Amagasaki, JP;
Shuji Tsutsumi, Ikoma, JP;
Mikinari Shimada, Yawata, JP;
Masakazu Tanahashi, Osaka, JP;
Akira Takahashi, Kadoma, JP;
Shouichi Imashuku, Moriguchi, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
A method for testing a precursor of a secondary cell with high reliability and high efficiency to judge the precursor to be acceptable or defective. The current flowing when a test voltage is applied between a pair of electrodes is measured before an electrolyte is placed between the electrodes. If a current the current value of which exceeds a predetermined reference current value () is detected during the time from the start of application of a voltage to a normal secondary cell precursor until the current becomes constant, the precursor is determined to be defective.