The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2007
Filed:
Feb. 09, 2005
Applicant:
Yoshikazu Iizuka, Kanagawa, JP;
Inventor:
Yoshikazu Iizuka, Kanagawa, JP;
Assignee:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/86 (2006.01);
U.S. Cl.
CPC ...
Abstract
A fault position identification system for a semiconductor device includes: a storage unit storing test data of the semiconductor device; a test result analyzer generating test parameters of the semiconductor device, based on failure information of a failure occurred in the semiconductor device; an emission controller controlling the semiconductor device to perform a circuit operation in which the failure occurs, by transmitting the test data corresponding to the test parameters to the semiconductor device; and an observation apparatus observing light emitted from a fault position and identifying the fault position.