The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 03, 2007

Filed:

Sep. 02, 2005
Applicants:

Hiroyuki Oumi, Yokohama, JP;

Hiroyuki Urushiya, Saitama, JP;

Inventors:

Hiroyuki Oumi, Yokohama, JP;

Hiroyuki Urushiya, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

Data of arbitrary penetration thickness can be easily obtained in carrying out a beam hardening calibration. A center tomographic image reconstructed parallel to a center line of a projection data of a water phantom and an X-ray tube is read from an image data server. The read center tomographic image is two-dimensionally modeled on a circle. A radius and a center coordinate of the circle on which the image is two-dimensionally modeled are used to re-arrange the X-ray tube, the sensor, and the modeled circle. Points of intersection A and B of the re-arranged circle and a path along which the X-rays reach the sensor from the X-ray tube are determined to obtain a penetration thickness of the water phantom based on the points of intersection A and B. Accordingly, in order to determine an attenuation property when the X-rays are penetrated through a subject, a larger quantity of data of an output value of a sensor with respect to the penetration thickness is gathered with ease.


Find Patent Forward Citations

Loading…