The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
Mar. 10, 2003
John Robert Lambert, Bellevue, WA (US);
John Robert Lambert, Bellevue, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Computerized testing of a system to identify combinations of input values that expose failures in the system's operation. Attributes are applied to fields in a source code version of a test case template corresponding to the object. Applied attributes can indicate fields that are to be used when generating test cases for the object. The source code version of the test case template is subsequently compiled or interpreted into a binary test case template. Metadata in the binary test case template is inspected (e.g., through reflection) to identify the fields, data types, and attributes that are to be used when generating test cases. Based on possible input values for the identified fields and generation rules, a plurality of test cases is generated. The generated test cases are executed to identify combinations of input values that expose failures in the system's operation.