The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
Oct. 12, 2005
Applicants:
Werner Obermaier, Xi'an, CN;
Andreas Baenisch, Munich, DE;
Uwe Mueller, Munich, DE;
Inventors:
Assignee:
Infineon Technologies AG, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract
In a method for monitoring layout changes for semiconductor chips, a first group of error data is generated by comparing a first layout with wiring and layout rules. A second group of error data is generated by comparing a second layout with the wiring and layout rules, the second layout being generated from layout changes of the first layout. The first group of error data is compared to the second group of error data and only error data that are different in the first and second groups is output for evaluation.